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  1. Unbenanntes Dokument

    Macrotron Scientific Engineering GmbH, Surface Mount Technology SMT, X-Ray Inspection, Laser Marker, Semiconductor Production Equipment SMC Backend, ...
    Verification2
    Process Control2
    SPC2
    BIB1
    Failure Analysis1
    MSE1
    optical inspection1
    Test Sockets1
    Prozesskontrolle1
    reflow oven1
    optische inspektion1
    Macrotron1
    Test Handler1
    Burn-In Board1
    Device Test1
    AIM Systems1
    sawing systems1
    IC Test Systems1
    Macrotron Systems1
    Pick & Place Handler1
    singulation systems1
    2D 3D vision inspection0
    Burn-In System0
    IC Handling0
    Macrotron Process Technology0
    Röntgen Reparatur0
    Strip Handler0
    Temperature Forcing System0
    X-AIP Software0
    X-PERT Verifizierung0
    X-Ray Repairstation0

    www.m-se.com - 2009-02-05

  2. A D V A N T E S T : Automated Test Equipment

    Advantest America, Inc. (AAI) is part of a broad-based organization with resources that span the globe. Around the world, our plants, equipment, research and ...
    semiconductor2
    hewlett packard2
    ATE1
    schlumberger1
    test systems1
    automatic test equipment1
    teradyne1
    advantest1
    test engineering1
    credence1
    ltx1
    memory test1
    IC test1
    test handler1
    mixed signal test1
    semiconductor test equipment1
    IC handler1
    IC test systems1
    logic test1
    VLSI test1
    advantest america1
    IC test equipment1

    www.advantest.com - 2009-02-08

  3. At-Spex LMO Test Systems

    At-Spex LMO designs, manufactures, sells and supports automated test equipment (ATE) throughout the world.
    semiconductor2
    hewlett packard2
    ATE1
    schlumberger1
    test systems1
    automatic test equipment1
    teradyne1
    advantest1
    test engineering1
    credence1
    ltx1
    memory test1
    IC test1
    test handler1
    mixed signal test1
    semiconductor test equipment1
    IC handler1
    IC test systems1
    logic test1
    VLSI test1
    advantest america1
    IC test equipment1

    www.at-spex.com - 2009-02-08

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